BPWin Release Highlights
- Improved STPL File Compilation for 9th Gen Platforms – Resolved a compilation error affecting STPL files that use variable-based delay commands on 9th Gen systems. This enhancement, identified in DSR-19141 with Microchip APA450-BG456I, improves support for delay commands using variables, ensuring successful compilation and more reliable script execution.
- Enhanced Self-Test for VOS Circuit on 9th & 10th Gen Programmers – Improved the self-test process for VOS circuit testing on 9th and 10th Gen programmer sites. This update addresses cases where self-tests could exhibit false failures related to Vcc and Vpp. As a result, self-tests now correctly pass for adapters such as the FVE4ASMC44BGSC and similar designs.
- Syntax Error Correction for EPV Operation – Resolved a syntax error that caused EPV operations to fail for algorithm RM48L952DZWTT due to the use of a reserved keyword in the script. The variable name was updated to prevent this issue, and EPV operations for this device now complete successfully. Users should retry the EPV operation for the RM48L952DZWTT to confirm proper functionality.
- Improved Self-Test Handling for Slave Socket Locations on 9th & 10th Gen Programmers – Enhanced the self-test functionality on 9th and 10th Gen programmer sites to correctly skip tests for pins connected to active circuitry on slave socket locations B, C, and D. This update resolves previously reported failures on certain socket cards (e.g., FVX4G2ASMR40LAPB) when tested on these locations. Self-tests will now pass as expected.
- Operator Guidance and Pressure Plate Handling Enhancements for BPM210/310 – A new dialog box now guides operators when the Stop button is clicked on BPM210 semi-automated programmer, helping confirm the door lid is closed and motors operate smoothly. Additionally, operators can now use the “Close All Sockets” button to raise the pressure plate even without a socket card installed, allowing for easy removal of the pressure plate when needed. Previously, a socket card was required to perform this action.
- 9th Gen Diagnostics Improvement – Enhanced the diagnostics process for 9th Gen programmers to eliminate hardware timeout errors during the self-test sequence. This update resolves previously reported timeout issues, resulting in more reliable and consistent self-test performance on 9th Gen systems.